Variation tolerant on-chip degradation sensors for dynamic reliability management systems

Y Wang, M Enachescu, SD Cotofana, L Fang

Research output: Contribution to journalArticleScientificpeer-review

17 Citations (Scopus)
Original languageEnglish
Pages (from-to)1-6
Number of pages6
JournalMicroelectronics Reliability
Volume52
Issue number9-10
Publication statusPublished - 2012

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