Variation tolerant on-chip degradation sensors for dynamic reliability management systems

Y Wang, M Enachescu, SD Cotofana, L Fang

Research output: Contribution to journal › Article › Scientific › peer-review

Original language	English
Pages (from-to)	1-6
Number of pages	6
Journal	Microelectronics Reliability
Volume	52
Issue number	9-10
Publication status	Published - 2012

Cite this

@article{ec8eea7064c6414386a9b5db519cf3bd,

title = "Variation tolerant on-chip degradation sensors for dynamic reliability management systems",

author = "Y Wang and M Enachescu and SD Cotofana and L Fang",

year = "2012",

language = "English",

volume = "52",

pages = "1--6",

journal = "Microelectronics Reliability",

issn = "0026-2714",

publisher = "Elsevier",

number = "9-10",

}

TY - JOUR

T1 - Variation tolerant on-chip degradation sensors for dynamic reliability management systems

AU - Wang, Y

AU - Enachescu, M

AU - Cotofana, SD

AU - Fang, L

PY - 2012

Y1 - 2012

UR - http://ce-publications.et.tudelft.nl/publications/1310_variation_tolerant_onchip_degradation_sensors_for_dynamic.pdf

M3 - Article

SN - 0026-2714

VL - 52

SP - 1

EP - 6

JO - Microelectronics Reliability

JF - Microelectronics Reliability

IS - 9-10

ER -