Varying characteristics of bipolar transistors with emitter contact window width

J Fu, S Mijalkovic, WJ Eysenga, HW van Zeijl, W Crans

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

Original languageUndefined/Unknown
Title of host publicationSISPAD'01: proceedings
Place of PublicationWien-NewYork
PublisherSpringer
Pages1-4
Number of pages4
ISBN (Print)3-211-83708-6
Publication statusPublished - 2001
EventSimulation of Semiconductor Processes and Devices, S.l. - Wien-NewYork
Duration: 5 Sep 20017 Sep 2001

Publication series

Name
PublisherSpringer-Verlag

Conference

ConferenceSimulation of Semiconductor Processes and Devices, S.l.
Period5/09/017/09/01

Keywords

  • ZX Int.klas.verslagjaar < 2002

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