Vector gain based EVM estimation at mm-wave frequencies

J. van 't Hof; C. De Martino; S. Malotaux; M. Squillante; M. Marchetti; L. Galatro; M. Spirito

doi:10.1109/ARFTG47271.2020.9241384

Vector gain based EVM estimation at mm-wave frequencies

J. van 't Hof, C. De Martino, S. Malotaux, M. Squillante, M. Marchetti, L. Galatro, M. Spirito

Electronics

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

3 Citations (Scopus)

Abstract

In this contribution we present a method for estimating linearity performance of devices operating in the higher millimeter-wave region, under modulated signals and over different loading conditions. The proposed method uses the power dependent vector gain extracted during continuous-wave large signal (load pull) measurements. The EVM prediction capability of the method is benchmarked with experimental load pull data with realistic modulated signals (QAM16) in the 5 GHz (RF) and in the 26 GHz (5G) bands on a 22nm CMOS FD-SOI device. The EVM estimated by the model correlates to the load pull measurements under complex modulated stimulus and properly predicts the best loading condition for linearity. Finally, the proposed method is used to estimate the EVM performance (QAM16) and the optimal loading condition for a 22nm CMOS-SOI device operating in the higher millimeter-wave region, at 165 GHz.

Original language	English
Title of host publication	2020 95th ARFTG Microwave Measurement Conference (ARFTG)
Subtitle of host publication	Proceedings
Publisher	IEEE
Pages	1-5
Number of pages	5
ISBN (Electronic)	978-1-7281-0951-0
ISBN (Print)	978-1-7281-0952-7
DOIs	https://doi.org/10.1109/ARFTG47271.2020.9241384
Publication status	Published - 2020
Event	ARFTG 2020: The 95th ARFTG Microwave Measurement Conference (ARFTG) - Los Angeles, United States Duration: 4 Aug 2020 → 6 Aug 2020 Conference number: 95

Conference

Conference	ARFTG 2020
Country/Territory	United States
City	Los Angeles
Period	4/08/20 → 6/08/20

Keywords

5G
EVM
linearity
mm-wave characterization
vector gain

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10.1109/ARFTG47271.2020.9241384

Cite this

@inproceedings{924b91a71fad445da0eb1fb802e3cb98,

title = "Vector gain based EVM estimation at mm-wave frequencies",

abstract = "In this contribution we present a method for estimating linearity performance of devices operating in the higher millimeter-wave region, under modulated signals and over different loading conditions. The proposed method uses the power dependent vector gain extracted during continuous-wave large signal (load pull) measurements. The EVM prediction capability of the method is benchmarked with experimental load pull data with realistic modulated signals (QAM16) in the 5 GHz (RF) and in the 26 GHz (5G) bands on a 22nm CMOS FD-SOI device. The EVM estimated by the model correlates to the load pull measurements under complex modulated stimulus and properly predicts the best loading condition for linearity. Finally, the proposed method is used to estimate the EVM performance (QAM16) and the optimal loading condition for a 22nm CMOS-SOI device operating in the higher millimeter-wave region, at 165 GHz.",

keywords = "5G, EVM, linearity, mm-wave characterization, vector gain",

author = "{van 't Hof}, J. and {De Martino}, C. and S. Malotaux and M. Squillante and M. Marchetti and L. Galatro and M. Spirito",

year = "2020",

doi = "10.1109/ARFTG47271.2020.9241384",

language = "English",

isbn = "978-1-7281-0952-7",

pages = "1--5",

booktitle = "2020 95th ARFTG Microwave Measurement Conference (ARFTG)",

publisher = "IEEE",

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note = "ARFTG 2020 : The 95th ARFTG Microwave Measurement Conference (ARFTG) ; Conference date: 04-08-2020 Through 06-08-2020",

}

TY - GEN

T1 - Vector gain based EVM estimation at mm-wave frequencies

AU - van 't Hof, J.

AU - De Martino, C.

AU - Malotaux, S.

AU - Squillante, M.

AU - Marchetti, M.

AU - Galatro, L.

AU - Spirito, M.

N1 - Conference code: 95

PY - 2020

Y1 - 2020

N2 - In this contribution we present a method for estimating linearity performance of devices operating in the higher millimeter-wave region, under modulated signals and over different loading conditions. The proposed method uses the power dependent vector gain extracted during continuous-wave large signal (load pull) measurements. The EVM prediction capability of the method is benchmarked with experimental load pull data with realistic modulated signals (QAM16) in the 5 GHz (RF) and in the 26 GHz (5G) bands on a 22nm CMOS FD-SOI device. The EVM estimated by the model correlates to the load pull measurements under complex modulated stimulus and properly predicts the best loading condition for linearity. Finally, the proposed method is used to estimate the EVM performance (QAM16) and the optimal loading condition for a 22nm CMOS-SOI device operating in the higher millimeter-wave region, at 165 GHz.

AB - In this contribution we present a method for estimating linearity performance of devices operating in the higher millimeter-wave region, under modulated signals and over different loading conditions. The proposed method uses the power dependent vector gain extracted during continuous-wave large signal (load pull) measurements. The EVM prediction capability of the method is benchmarked with experimental load pull data with realistic modulated signals (QAM16) in the 5 GHz (RF) and in the 26 GHz (5G) bands on a 22nm CMOS FD-SOI device. The EVM estimated by the model correlates to the load pull measurements under complex modulated stimulus and properly predicts the best loading condition for linearity. Finally, the proposed method is used to estimate the EVM performance (QAM16) and the optimal loading condition for a 22nm CMOS-SOI device operating in the higher millimeter-wave region, at 165 GHz.

KW - 5G

KW - EVM

KW - linearity

KW - mm-wave characterization

KW - vector gain

UR - http://www.scopus.com/inward/record.url?scp=85096942508&partnerID=8YFLogxK

U2 - 10.1109/ARFTG47271.2020.9241384

DO - 10.1109/ARFTG47271.2020.9241384

M3 - Conference contribution

SN - 978-1-7281-0952-7

SP - 1

EP - 5

BT - 2020 95th ARFTG Microwave Measurement Conference (ARFTG)

PB - IEEE

T2 - ARFTG 2020

Y2 - 4 August 2020 through 6 August 2020

ER -

Vector gain based EVM estimation at mm-wave frequencies

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Keywords

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