Vector gain based EVM estimation at mm-wave frequencies

J. van 't Hof, C. De Martino, S. Malotaux, M. Squillante, M. Marchetti, L. Galatro, M. Spirito

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

Abstract

In this contribution we present a method for estimating linearity performance of devices operating in the higher millimeter-wave region, under modulated signals and over different loading conditions. The proposed method uses the power dependent vector gain extracted during continuous-wave large signal (load pull) measurements. The EVM prediction capability of the method is benchmarked with experimental load pull data with realistic modulated signals (QAM16) in the 5 GHz (RF) and in the 26 GHz (5G) bands on a 22nm CMOS FD-SOI device. The EVM estimated by the model correlates to the load pull measurements under complex modulated stimulus and properly predicts the best loading condition for linearity. Finally, the proposed method is used to estimate the EVM performance (QAM16) and the optimal loading condition for a 22nm CMOS-SOI device operating in the higher millimeter-wave region, at 165 GHz.
Original languageEnglish
Title of host publication2020 95th ARFTG Microwave Measurement Conference (ARFTG)
Subtitle of host publicationProceedings
PublisherIEEE
Pages1-5
Number of pages5
ISBN (Electronic)978-1-7281-0951-0
ISBN (Print)978-1-7281-0952-7
DOIs
Publication statusPublished - 2020
EventARFTG 2020: The 95th ARFTG Microwave Measurement Conference (ARFTG) - Los Angeles, United States
Duration: 4 Aug 20206 Aug 2020
Conference number: 95

Conference

ConferenceARFTG 2020
CountryUnited States
CityLos Angeles
Period4/08/206/08/20

Keywords

  • 5G
  • EVM
  • linearity
  • mm-wave characterization
  • vector gain

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