VEHIL: test facility for fault management testing of advanced driver assistance system

OJ Gietelink, J Ploeg, BHK Schutter, MHG Verhaegen

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientific

Original languageUndefined/Unknown
Title of host publication10th world congress on intelligent transport systems and services
Editors S.n.
PublisherERTICO
Pages1-13
Number of pages13
Publication statusPublished - 2003

Publication series

Name
PublisherERTICO

Keywords

  • Conf.proc. > 3 pag

Cite this

Gietelink, OJ., Ploeg, J., Schutter, BHK., & Verhaegen, MHG. (2003). VEHIL: test facility for fault management testing of advanced driver assistance system. In S.n. (Ed.), 10th world congress on intelligent transport systems and services (pp. 1-13). ERTICO.