Verification of the simultaneous local extraction method of base and thermal resistance of bipolar transistors

R Setekera; LF Tiemeijer; R van der Toorn

Verification of the simultaneous local extraction method of base and thermal resistance of bipolar transistors

R Setekera, LF Tiemeijer, R van der Toorn

Research output: Contribution to journal › Article › peer-review

Original language	English
Pages (from-to)	1445-1449
Number of pages	5
Journal	World Academy of Science, Engineering and Technology. Proceedings
Volume	8
Issue number	10
Publication status	Published - 2014

Cite this

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title = "Verification of the simultaneous local extraction method of base and thermal resistance of bipolar transistors",

author = "R Setekera and LF Tiemeijer and {van der Toorn}, R",

year = "2014",

language = "English",

volume = "8",

pages = "1445--1449",

journal = "World Academy of Science, Engineering and Technology. Proceedings",

issn = "2010-3778",

publisher = "World Academy of Science Engineering and Technology",

number = "10",

}

TY - JOUR

T1 - Verification of the simultaneous local extraction method of base and thermal resistance of bipolar transistors

AU - Setekera, R

AU - Tiemeijer, LF

AU - van der Toorn, R

PY - 2014

Y1 - 2014

UR - http://waset.org/Publication/verification-of-the-simultaneous-local-extraction-method-of-base-and-thermal-resistance-of-bipolar-transistors/9999395

M3 - Article

VL - 8

SP - 1445

EP - 1449

JO - World Academy of Science, Engineering and Technology. Proceedings

JF - World Academy of Science, Engineering and Technology. Proceedings

SN - 2010-3778

IS - 10

ER -

Verification of the simultaneous local extraction method of base and thermal resistance of bipolar transistors

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