Verification of the simultaneous local extraction method of base and thermal resistance of bipolar transistors

R Setekera, LF Tiemeijer, R van der Toorn

Research output: Contribution to journalArticlepeer-review

Original languageEnglish
Pages (from-to)1445-1449
Number of pages5
JournalWorld Academy of Science, Engineering and Technology. Proceedings
Issue number10
Publication statusPublished - 2014

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