Visual Patterns in Issue Tracking Data

P Knab; M Pinzger; HC Gall

Visual Patterns in Issue Tracking Data

P Knab, M Pinzger, HC Gall

Software Engineering

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

10 Citations (Scopus)

Original language	English
Title of host publication	New Modeling Concepts for Today¿s Software Processes
Editors	J Muench, Y Yang, W Schaefer
Place of Publication	Berlin
Publisher	Springer Science+Business Media
Pages	222-233
Number of pages	12
ISBN (Print)	978-3-642-14346-5
Publication status	Published - 2010
Event	International Conference on New Modeling Concepts for Today's Software Processes (ICSP 2010) - Berlin Duration: 8 Jul 2010 → 9 Jul 2010

Publication series

Name
Publisher	Springer-Verlag

Conference

Conference	International Conference on New Modeling Concepts for Today's Software Processes (ICSP 2010)
Period	8/07/10 → 9/07/10

Keywords

CWTS JFIS < 0.75

Cite this

@inproceedings{c103e895dc55448fb826089e9b66da5f,

title = "Visual Patterns in Issue Tracking Data",

keywords = "CWTS JFIS < 0.75",

author = "P Knab and M Pinzger and HC Gall",

year = "2010",

language = "English",

isbn = "978-3-642-14346-5",

publisher = "Springer Science+Business Media",

pages = "222--233",

editor = "J Muench and Y Yang and W Schaefer",

booktitle = "New Modeling Concepts for Today¿s Software Processes",

note = "International Conference on New Modeling Concepts for Today's Software Processes (ICSP 2010) ; Conference date: 08-07-2010 Through 09-07-2010",

}

TY - GEN

T1 - Visual Patterns in Issue Tracking Data

AU - Knab, P

AU - Pinzger, M

AU - Gall, HC

PY - 2010

Y1 - 2010

KW - CWTS JFIS < 0.75

UR - http://swerl.tudelft.nl/twiki/pub/Main/TechnicalReports/TUD-SERG-2010-016.pdf

M3 - Conference contribution

SN - 978-3-642-14346-5

SP - 222

EP - 233

BT - New Modeling Concepts for Today¿s Software Processes

A2 - Muench, J

A2 - Yang, Y

A2 - Schaefer, W

PB - Springer Science+Business Media

CY - Berlin

T2 - International Conference on New Modeling Concepts for Today's Software Processes (ICSP 2010)

Y2 - 8 July 2010 through 9 July 2010

ER -

Visual Patterns in Issue Tracking Data

Publication series

Conference

Keywords

Other files and links

Cite this