Voltage sensitivity calculation for ViVo-based gate models considering process variations

Q Tang, A Zjajo, MRCM Berkelaar, NP van der Meijs

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

Original language	English
Title of host publication	Proceedings of IPA Fall Days/ICT.Open 2011
Editors	D Stroobandt, et al.
Place of Publication	Veldhoven. The Netherlands
Publisher	NWO
Pages	1-4
Number of pages	4
Publication status	Published - 2011
Event	ICT.OPEN 2011 - Veldhoven, The Netherlands Duration: 14 Nov 2011 → 15 Nov 2011

Name
Publisher	NWO

Conference	ICT.OPEN 2011
Period	14/11/11 → 15/11/11

Keywords

@inproceedings{3ff9351c1fc440f4acfbf0470ed2ab84,

title = "Voltage sensitivity calculation for ViVo-based gate models considering process variations",

keywords = "Conf.proc. > 3 pag",

author = "Q Tang and A Zjajo and MRCM Berkelaar and {van der Meijs}, NP",

year = "2011",

language = "English",

publisher = "NWO",

pages = "1--4",

editor = "D Stroobandt and {et al.}",

booktitle = "Proceedings of IPA Fall Days/ICT.Open 2011",

note = "ICT.OPEN 2011 ; Conference date: 14-11-2011 Through 15-11-2011",

}

Voltage sensitivity calculation for ViVo-based gate models considering process variations. / Tang, Q; Zjajo, A; Berkelaar, MRCM et al.
Proceedings of IPA Fall Days/ICT.Open 2011. ed. / D Stroobandt; et al. Veldhoven. The Netherlands: NWO, 2011. p. 1-4.

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

TY - GEN

T1 - Voltage sensitivity calculation for ViVo-based gate models considering process variations

AU - Tang, Q

AU - Zjajo, A

AU - Berkelaar, MRCM

AU - van der Meijs, NP

PY - 2011

Y1 - 2011

KW - Conf.proc. > 3 pag

M3 - Conference contribution

SP - 1

EP - 4

BT - Proceedings of IPA Fall Days/ICT.Open 2011

A2 - Stroobandt, D

A2 - et al., null

PB - NWO

CY - Veldhoven. The Netherlands

T2 - ICT.OPEN 2011

Y2 - 14 November 2011 through 15 November 2011

ER -