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Wafer-scale low-disorder 2DEG in 28Si/SiGe without an epitaxial Si cap
Davide Degli Esposti, Brian Paquelet Wuetz, Viviana Fezzi, Mario Lodari, Amir Sammak, Giordano Scappucci*
*Corresponding author for this work
Research output: Contribution to journal › Article › Scientific › peer-review
3
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