Wafer-scale measurements of the specific contact resistance between different metals and mono- and multi-layer graphene

Sten Vollebregt, Manvika Singh, Dominique Wehenkel, Richard van Rijn, Lina Sarro

Research output: Contribution to conference › Abstract › Scientific

Original language	English
Pages	152-152
Number of pages	1
Publication status	Published - 2017
Event	MNE 2017: 43rd International Conference on Micro and Nanoengineering - Braga, Portugal Duration: 18 Sept 2017 → 22 Sept 2017

Cite this

@conference{0f6ecb598ac943c78a668ca23c9a0e6b,

title = "Wafer-scale measurements of the specific contact resistance between different metals and mono- and multi-layer graphene",

author = "Sten Vollebregt and Manvika Singh and Dominique Wehenkel and {van Rijn}, Richard and Lina Sarro",

year = "2017",

language = "English",

pages = "152--152",

note = "MNE 2017 : 43rd International Conference on Micro and Nanoengineering ; Conference date: 18-09-2017 Through 22-09-2017",

}