TY - GEN
T1 - Well-informed Test Case Generation and Crash Reproduction
AU - Derakhshanfar, Pouria
PY - 2020
Y1 - 2020
N2 - Search-based test data generation approaches have come a long way over the past few years, but these approaches still have some limitations when it comes to exercising specific behavior for triggering particular kinds of faults (e.g., crashes or specific types of integration between classes/modules). In this thesis, we are investigating new fitness functions and evolutionary-based algorithms and techniques to tackle these limitations. We have defined multiple novel approaches for crash reproduction and class integration testing. Currently, we are still working on improving both crash reproduction and class integration testing.
AB - Search-based test data generation approaches have come a long way over the past few years, but these approaches still have some limitations when it comes to exercising specific behavior for triggering particular kinds of faults (e.g., crashes or specific types of integration between classes/modules). In this thesis, we are investigating new fitness functions and evolutionary-based algorithms and techniques to tackle these limitations. We have defined multiple novel approaches for crash reproduction and class integration testing. Currently, we are still working on improving both crash reproduction and class integration testing.
KW - automated crash reproduction
KW - automated integration testing
KW - search-based software testing
UR - http://www.scopus.com/inward/record.url?scp=85091593446&partnerID=8YFLogxK
U2 - 10.1109/ICST46399.2020.00054
DO - 10.1109/ICST46399.2020.00054
M3 - Conference contribution
AN - SCOPUS:85091593446
SN - 978-1-7281-5779-5
T3 - 2020 IEEE 13TH INTERNATIONAL CONFERENCE ON SOFTWARE TESTING, VALIDATION AND VERIFICATION (ICST 2020)
SP - 424
EP - 426
BT - 2020 IEEE 13th International Conference on Software Testing, Validation and Verification (ICST)
A2 - O'Conner, E.
PB - IEEE
CY - Piscataway
T2 - 13th IEEE International Conference on Software Testing, Verification and Validation, ICST 2020
Y2 - 23 March 2020 through 27 March 2020
ER -