@inproceedings{55ec212e459f4c5eb17b90fa4969744e,
title = "Why is CMOS scaling coming to an END?",
keywords = "conference contrib. refereed, Conf.proc. > 3 pag",
author = "NZB Haron and S Hamdioui",
note = "neo; IDT2008 ; Conference date: 20-12-2008 Through 22-12-2008",
year = "2008",
language = "Undefined/Unknown",
isbn = "978-1-4244-3477-0",
publisher = "IEEE",
pages = "98--103",
editor = "M Abid and M Loulou and A Salem and Y Zorian and A Ivanov",
booktitle = "2008 Third international design and test workshop",
address = "United States",
}