Why is CMOS scaling coming to an END?

NZB Haron, S Hamdioui

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

114 Citations (Scopus)
Original languageUndefined/Unknown
Title of host publication2008 Third international design and test workshop
EditorsM Abid, M Loulou, A Salem, Y Zorian, A Ivanov
Place of PublicationPiscataway
PublisherIEEE Society
Pages98-103
Number of pages6
ISBN (Print)978-1-4244-3477-0
Publication statusPublished - 2008
EventIDT2008 - Piscataway
Duration: 20 Dec 200822 Dec 2008

Publication series

Name
PublisherIEEE

Conference

ConferenceIDT2008
Period20/12/0822/12/08

Keywords

  • conference contrib. refereed
  • Conf.proc. > 3 pag

Cite this