X-ray diffraction analysis of stacking and twin faults in f.c.c. metals: a revision and allowance for texture and non-uniform fault probabilities.

L Velterop, R Delhez, Th.H de Keijser, EJ Mittemeijer, D Reefman

    Research output: Contribution to journalArticleScientificpeer-review

    121 Citations (Scopus)
    Original languageUndefined/Unknown
    Pages (from-to)296-306
    Number of pages11
    JournalJournal of Applied Crystallography
    Volume33
    Publication statusPublished - 2000

    Keywords

    • ZX Int.klas.verslagjaar < 2002

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