X-ray diffraction analysis of stacking and twin faults in f.c.c. metals: a revision and allowance for texture and non-uniform fault probabilities.

L Velterop; R Delhez; Th.H de Keijser; EJ Mittemeijer; D Reefman

X-ray diffraction analysis of stacking and twin faults in f.c.c. metals: a revision and allowance for texture and non-uniform fault probabilities.

L Velterop, R Delhez, Th.H de Keijser, EJ Mittemeijer, D Reefman

Research output: Contribution to journal › Article › Scientific › peer-review

Original language	Undefined/Unknown
Pages (from-to)	296-306
Number of pages	11
Journal	Journal of Applied Crystallography
Volume	33
Publication status	Published - 2000

Bibliographical note

ISSN 0021-8898

Keywords

ZX Int.klas.verslagjaar < 2002

Cite this

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title = "X-ray diffraction analysis of stacking and twin faults in f.c.c. metals: a revision and allowance for texture and non-uniform fault probabilities.",

keywords = "ZX Int.klas.verslagjaar < 2002",

author = "L Velterop and R Delhez and {de Keijser}, Th.H and EJ Mittemeijer and D Reefman",

note = "ISSN 0021-8898",

year = "2000",

language = "Undefined/Unknown",

volume = "33",

pages = "296--306",

journal = "Journal of Applied Crystallography",

issn = "0021-8898",

publisher = "International Union of Crystallography",

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TY - JOUR

T1 - X-ray diffraction analysis of stacking and twin faults in f.c.c. metals: a revision and allowance for texture and non-uniform fault probabilities.

AU - Velterop, L

AU - Delhez, R

AU - de Keijser, Th.H

AU - Mittemeijer, EJ

AU - Reefman, D

N1 - ISSN 0021-8898

PY - 2000

Y1 - 2000

KW - ZX Int.klas.verslagjaar < 2002

M3 - Article

SN - 0021-8898

VL - 33

SP - 296

EP - 306

JO - Journal of Applied Crystallography

JF - Journal of Applied Crystallography

ER -