X-ray diffraction study of the composition and strain fields in buried SiGe islands

N Hrauda, JJ Zhang, M Stoffel, J Stangl, G Bauer, A Rehman-Khan, V Holy, OG Schmist, V Jovanovic, LK Nanver

Research output: Contribution to journalArticleScientificpeer-review

5 Citations (Scopus)
Original languageUndefined/Unknown
Pages (from-to)41-46
Number of pages6
JournalThe European Physical Journal. Special Topics
Volume167
Publication statusPublished - 2009

Keywords

  • Elektrotechniek
  • Techniek
  • CWTS JFIS < 0.75

Cite this

Hrauda, N., Zhang, JJ., Stoffel, M., Stangl, J., Bauer, G., Rehman-Khan, A., Holy, V., Schmist, OG., Jovanovic, V., & Nanver, LK. (2009). X-ray diffraction study of the composition and strain fields in buried SiGe islands. The European Physical Journal. Special Topics, 167, 41-46.