X-ray diffraction study of the composition and strain fields in buried SiGe islands

N Hrauda, JJ Zhang, M Stoffel, J Stangl, G Bauer, A Rehman-Khan, V Holy, OG Schmist, V Jovanovic, LK Nanver

Research output: Contribution to journal › Article › Scientific › peer-review

Original language	Undefined/Unknown
Pages (from-to)	41-46
Number of pages	6
Journal	The European Physical Journal. Special Topics
Volume	167
Publication status	Published - 2009

Keywords

@article{cdd92f2134244bd08c076afb49fdb94c,

title = "X-ray diffraction study of the composition and strain fields in buried SiGe islands",

keywords = "Elektrotechniek, Techniek, CWTS JFIS < 0.75",

author = "N Hrauda and JJ Zhang and M Stoffel and J Stangl and G Bauer and A Rehman-Khan and V Holy and OG Schmist and V Jovanovic and LK Nanver",

year = "2009",

language = "Undefined/Unknown",

volume = "167",

pages = "41--46",

journal = "The European Physical Journal. Special Topics",

issn = "1951-6355",

publisher = "EDP Sciences",

}

TY - JOUR

T1 - X-ray diffraction study of the composition and strain fields in buried SiGe islands

AU - Hrauda, N

AU - Zhang, JJ

AU - Stoffel, M

AU - Stangl, J

AU - Bauer, G

AU - Rehman-Khan, A

AU - Holy, V

AU - Schmist, OG

AU - Jovanovic, V

AU - Nanver, LK

PY - 2009

Y1 - 2009

KW - Elektrotechniek

KW - Techniek

KW - CWTS JFIS < 0.75

M3 - Article

SN - 1951-6355

VL - 167

SP - 41

EP - 46

JO - The European Physical Journal. Special Topics

JF - The European Physical Journal. Special Topics

ER -