X-Ray Micro Tomography and image analysis as complementary methods for morphological characterization and coating thickness measurement of coated particles

G Perfetti, E Casteele, B Rieger, w.j. wildeboer, GMH Meesters

    Research output: Contribution to journalArticleScientificpeer-review

    31 Citations (Scopus)
    Original languageEnglish
    Pages (from-to)663-675
    Number of pages13
    JournalAdvanced Powder Technology
    Volume21
    Publication statusPublished - 2010

    Keywords

    • CWTS JFIS < 0.75

    Cite this