X-Ray Micro Tomography and image analysis as complementary methods for morphological characterization and coating thickness measurement of coated particles

G Perfetti; E Casteele; B Rieger; w.j. wildeboer; GMH Meesters

X-Ray Micro Tomography and image analysis as complementary methods for morphological characterization and coating thickness measurement of coated particles

G Perfetti
, E Casteele
, B Rieger
, w.j. wildeboer
, GMH Meesters

Research output: Contribution to journal › Article › Scientific › peer-review

Original language	English
Pages (from-to)	663-675
Number of pages	13
Journal	Advanced Powder Technology
Volume	21
Publication status	Published - 2010

Keywords

CWTS JFIS < 0.75

Cite this

@article{414f2b52b6904543a9905faa90c75a17,

title = "X-Ray Micro Tomography and image analysis as complementary methods for morphological characterization and coating thickness measurement of coated particles",

keywords = "CWTS JFIS < 0.75",

author = "G Perfetti and E Casteele and B Rieger and w.j. wildeboer and GMH Meesters",

year = "2010",

language = "English",

volume = "21",

pages = "663--675",

journal = "Advanced Powder Technology",

issn = "0921-8831",

publisher = "Elsevier",

}

TY - JOUR

T1 - X-Ray Micro Tomography and image analysis as complementary methods for morphological characterization and coating thickness measurement of coated particles

AU - Perfetti, G

AU - Casteele, E

AU - Rieger, B

AU - wildeboer, w.j.

AU - Meesters, GMH

PY - 2010

Y1 - 2010

KW - CWTS JFIS < 0.75

M3 - Article

SN - 0921-8831

VL - 21

SP - 663

EP - 675

JO - Advanced Powder Technology

JF - Advanced Powder Technology

ER -