X-ray nanodiffraction on a single SiGe quantum dot inside a functioning field-effect transistor

N Hrauda, J Zhang, E Wintersberger, T Etzelstorfer, B Mandl, J Stangl, D Carbone, V Holy, V Jovanovic, C Biasotto, LK Nanver, J Moers, D Grutzmacher, G Baur

Research output: Contribution to journalArticleScientificpeer-review

56 Citations (Scopus)
Original languageEnglish
Pages (from-to)2875-2880
Number of pages6
JournalNano Letters: a journal dedicated to nanoscience and nanotechnology
Issue number7
Publication statusPublished - 2011


  • academic journal papers
  • CWTS JFIS >= 2.00

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