X-ray photoelectron spectroscopy study of MgH2 thin films grown by reactive sputtering

IJT Jensen, S Diplas, OM Lovvik, J Watts, S Hinder, H Schreuders, B Dam

Research output: Contribution to journalArticleScientificpeer-review

2 Citations (Scopus)
Original languageEnglish
Pages (from-to)1140-1143
Number of pages4
JournalSurface and Interface Analysis
Volume42
Issue number6-7
Publication statusPublished - 2010

Keywords

  • CWTS JFIS < 0.75

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