X-ray photoelectron spectroscopy study of MgH2 thin films grown by reactive sputtering

IJT Jensen, S Diplas, OM Lovvik, J Watts, S Hinder, H Schreuders, B Dam

Research output: Contribution to journal › Article › Scientific › peer-review

Original language	English
Pages (from-to)	1140-1143
Number of pages	4
Journal	Surface and Interface Analysis
Volume	42
Issue number	6-7
Publication status	Published - 2010

Keywords

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title = "X-ray photoelectron spectroscopy study of MgH2 thin films grown by reactive sputtering",

keywords = "CWTS JFIS < 0.75",

author = "IJT Jensen and S Diplas and OM Lovvik and J Watts and S Hinder and H Schreuders and B Dam",

year = "2010",

language = "English",

volume = "42",

pages = "1140--1143",

journal = "Surface and Interface Analysis",

issn = "0142-2421",

publisher = "John Wiley and Sons",

number = "6-7",

}

TY - JOUR

T1 - X-ray photoelectron spectroscopy study of MgH2 thin films grown by reactive sputtering

AU - Jensen, IJT

AU - Diplas, S

AU - Lovvik, OM

AU - Watts, J

AU - Hinder, S

AU - Schreuders, H

AU - Dam, B

PY - 2010

Y1 - 2010

KW - CWTS JFIS < 0.75

M3 - Article

SN - 0142-2421

VL - 42

SP - 1140

EP - 1143

JO - Surface and Interface Analysis

JF - Surface and Interface Analysis

IS - 6-7

ER -