X-ray radiation effect on CMOS imagers with in-pixel buried-channel source follower

Y Chen, J Tan, X Wang, AJ Mierop, AJP Theuwissen

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

3 Citations (Scopus)
Original languageEnglish
Title of host publication41st IEEE European Solid-State Device Research Conference (ESSDERC) 2011
EditorsH Tenhunen, M Aberg
Place of PublicationHelsinki, Finland
PublisherIEEE Society
Pages155-158
Number of pages4
ISBN (Print)978-1-4577-0706-3
DOIs
Publication statusPublished - 2011
Event41st IEEE ESSDERC 2011 - Helsinki, Finland
Duration: 12 Sep 201116 Sep 2011

Publication series

Name
PublisherIEEE

Conference

Conference41st IEEE ESSDERC 2011
Period12/09/1116/09/11

Keywords

  • Elektrotechniek
  • Techniek

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