X-ray radiation effect on CMOS imagers with in-pixel buried-channel source follower

Y Chen; J Tan; X Wang; AJ Mierop; AJP Theuwissen

doi:10.1109/ESSDERC.2011.6044211

X-ray radiation effect on CMOS imagers with in-pixel buried-channel source follower

Y Chen, J Tan, X Wang, AJ Mierop, AJP Theuwissen

Electronic Instrumentation

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

3 Citations (Scopus)

Original language	English
Title of host publication	41st IEEE European Solid-State Device Research Conference (ESSDERC) 2011
Editors	H Tenhunen, M Aberg
Place of Publication	Helsinki, Finland
Publisher	IEEE
Pages	155-158
Number of pages	4
ISBN (Print)	978-1-4577-0706-3
DOIs	https://doi.org/10.1109/ESSDERC.2011.6044211
Publication status	Published - 2011
Event	41st IEEE ESSDERC 2011 - Helsinki, Finland Duration: 12 Sept 2011 → 16 Sept 2011

Publication series

Name
Publisher	IEEE

Conference

Conference	41st IEEE ESSDERC 2011
Period	12/09/11 → 16/09/11

Keywords

Elektrotechniek
Techniek

Access to Document

10.1109/ESSDERC.2011.6044211

Cite this

@inproceedings{35be0e8b499a472f91109fba8d989b36,

title = "X-ray radiation effect on CMOS imagers with in-pixel buried-channel source follower",

keywords = "Elektrotechniek, Techniek",

author = "Y Chen and J Tan and X Wang and AJ Mierop and AJP Theuwissen",

year = "2011",

doi = "10.1109/ESSDERC.2011.6044211",

language = "English",

isbn = "978-1-4577-0706-3",

publisher = "IEEE",

pages = "155--158",

editor = "H Tenhunen and M Aberg",

booktitle = "41st IEEE European Solid-State Device Research Conference (ESSDERC) 2011",

address = "United States",

note = "41st IEEE ESSDERC 2011 ; Conference date: 12-09-2011 Through 16-09-2011",

}

X-ray radiation effect on CMOS imagers with in-pixel buried-channel source follower. / Chen, Y; Tan, J; Wang, X et al.
41st IEEE European Solid-State Device Research Conference (ESSDERC) 2011. ed. / H Tenhunen; M Aberg. Helsinki, Finland: IEEE, 2011. p. 155-158.

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

TY - GEN

T1 - X-ray radiation effect on CMOS imagers with in-pixel buried-channel source follower

AU - Chen, Y

AU - Tan, J

AU - Wang, X

AU - Mierop, AJ

AU - Theuwissen, AJP

PY - 2011

Y1 - 2011

KW - Elektrotechniek

KW - Techniek

U2 - 10.1109/ESSDERC.2011.6044211

DO - 10.1109/ESSDERC.2011.6044211

M3 - Conference contribution

SN - 978-1-4577-0706-3

SP - 155

EP - 158

BT - 41st IEEE European Solid-State Device Research Conference (ESSDERC) 2011

A2 - Tenhunen, H

A2 - Aberg, M

PB - IEEE

CY - Helsinki, Finland

T2 - 41st IEEE ESSDERC 2011

Y2 - 12 September 2011 through 16 September 2011

ER -