X-ray radiation effects on CMOS image sensor in-pixel devices

J Tan, B Buttgen, AJP Theuwissen

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientific

Original languageEnglish
Title of host publicationProceedings of International conference on solid-state devices and materials 2010
Editors s.n.
Place of PublicationTokyo, Japan
Pages299-300
Number of pages2
Publication statusPublished - 2010
EventInternational conference on solid-state devices and materials 2010 - Tokyo, Japan
Duration: 22 Sep 201024 Sep 2010

Conference

ConferenceInternational conference on solid-state devices and materials 2010
Period22/09/1024/09/10

Keywords

  • conference contrib. non-refer.
  • Geen BTA classificatie

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