X-ray spectroscopy measurements with multi-anode saw tooth silicon drift detector

Research output: Chapter in Book/Conference proceedings/Edited volumeChapterScientific

Original languageUndefined/Unknown
Title of host publicationBook of abstracts of the 5th International Conference on Position-Sensitive Detectors, University College London, September 13-17, 1999, United Kingdom
Pages24-24
Publication statusPublished - 1999

Keywords

  • ZX Int.klas.verslagjaar < 2002

Cite this

Sonsky, J., Huizenga, J., van Eijk, CWE., & Sarro, PM. (1999). X-ray spectroscopy measurements with multi-anode saw tooth silicon drift detector. In Book of abstracts of the 5th International Conference on Position-Sensitive Detectors, University College London, September 13-17, 1999, United Kingdom (pp. 24-24)