Yield and cost analysis or 3D stacked ICs

Research output: ThesisDissertation (TU Delft)

Original languageEnglish
QualificationDoctor of Philosophy
Awarding Institution
  • Delft University of Technology
Supervisors/Advisors
  • Bertels, K.L.M., Supervisor
Award date5 Sep 2014
Print ISBNs978-94-6186-331-7
DOIs
Publication statusPublished - 2014

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