Yield-based process capability indices for nonnormal continuous data

Piao Chen, Bing Xing Wang, Zhi Sheng Ye

Research output: Contribution to journalArticleScientificpeer-review

18 Citations (Scopus)
2 Downloads (Pure)

Fingerprint

Dive into the research topics of 'Yield-based process capability indices for nonnormal continuous data'. Together they form a unique fingerprint.

INIS

Mathematics

Keyphrases