Abstract
This article focuses on the parasitic light sensitivity (PLS) of a commercially available CMOS camera with a global shutter (with a storage node in the charge domain) and shared pixel architecture. The PLS is characterized as a function of both the wavelength and the incident angle of the incoming light. The measurement results are linked to the layout of the pixels to understand and explain the obtained characterization data.
Original language | English |
---|---|
Pages (from-to) | 2938-2942 |
Number of pages | 5 |
Journal | IEEE Transactions on Electron Devices |
Volume | 69 |
Issue number | 6 |
DOIs | |
Publication status | Published - 2022 |
Bibliographical note
Green Open Access added to TU Delft Institutional Repository 'You share, we take care!' - Taverne project https://www.openaccess.nl/en/you-share-we-take-careOtherwise as indicated in the copyright section: the publisher is the copyright holder of this work and the author uses the Dutch legislation to make this work public.
Keywords
- Charge coupled devices
- CMOS image sensor
- CMOS image sensors
- global shutter
- Layout
- parasitic light sensitivity (PLS)
- Photodiodes
- Sensitivity
- shutter efficiency (SE)
- Temperature measurement
- wavelength dependency.
- Wavelength measurement