@inproceedings{ab52690c26ba42148cd1480154a3cb3a,
title = "Experimental results of an innovative dynamic low-coherent interferometer for characterizing a gravitational wave detector",
abstract = "We present the experimental results of the proof of concept of a metrology instrument developed to characterize the cryogenic mirror of the Einstein Telescope (ET) prototype. ET is a proposed gravitational-wave observatory. The metrology instrument uses the principle of low-coherence interferometry to measure the local change in topology and local induced vibrations of the mirror resulting from the cooling down process. We implement an innovative optical phase mask and a microlens array to obtain a depth map of the mirror on a single camera frame. With our instrument prototype, we can obtain 25 interference patterns of the same mirror spot for each camera frame. Each interference pattern corresponds to a difference Optical Path Difference (OPD). Then by reconstructing the interference patterns, we can measure the mirror{\textquoteright}s local topology change and local induced vibration. Moreover, in this proceeding, we describe the analysis of the white-light interference patterns through numerical simulations and depict the metrology instrument{\textquoteright}s optical design. Finally, we discuss how we can use the metrology instrument for real-time characterization of other optical components with all the advantages of white light interferometry. ",
keywords = "White Light Interferometry, Dynamical Interferometry, Optical Phase Mask, Single-Frame lowcoherence Interferometry, Gravitational Wave Detector",
author = "{Vilaboa P{\'e}rez}, Jes{\'u}s and Marc Georges and Juriy Hastanin and J.J.D. Loicq",
year = "2023",
doi = "10.1117/12.2677489",
language = "English",
volume = "12672",
series = "Proceedings of SPIE - The International Society for Optical Engineering",
publisher = "SPIE",
editor = "Novak, {Erik } and Wilcox, {Christopher C. }",
booktitle = "Applied Optical Metrology V",
address = "United States",
note = "SPIE optical engineering + applications ; Conference date: 20-08-2023 Through 25-08-2023",
}