Abstract
An attachment has been developed for x-ray diffractometer systems equipped with a domed stage when using a 2D or 1D detector. It consists of a single screen in front of the detector positioned such that it blocks diffraction from the dome. This results in measured data free of disturbing spurious peaks and background, thereby greatly facilitating further data analysis. Its working principle is universally applicable and allows for all specimen orientation movements needed for x-ray diffraction measurements, including texture, stress, and mapping.
Original language | English |
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Article number | 103102 |
Number of pages | 6 |
Journal | Review of Scientific Instruments |
Volume | 92 |
Issue number | 10 |
DOIs | |
Publication status | Published - 2021 |