Effect of excitation frequency on tip wear in tapping mode atomic force microscopy

A Keyvani Janbahan, H Sadeghian Marnani, JFL Goosen, F van Keulen

Research output: Contribution to conference › Poster › Professional

Original language	English
Publication status	Published - 2014
Event	International Scanning Probe Microscopy Conference 2014 (ISPM-2014) - Seoul, Korea Duration: 30 Jun 2014 → 2 Jul 2014

Conference	International Scanning Probe Microscopy Conference 2014 (ISPM-2014)
Period	30/06/14 → 2/07/14

Cite this

@conference{3443ca7dd4774f018b0dcd30aeee5e95,

title = "Effect of excitation frequency on tip wear in tapping mode atomic force microscopy",

author = "{Keyvani Janbahan}, A and {Sadeghian Marnani}, H and JFL Goosen and {van Keulen}, F",

year = "2014",

language = "English",

note = "International Scanning Probe Microscopy Conference 2014 (ISPM-2014) ; Conference date: 30-06-2014 Through 02-07-2014",

}

TY - CONF

T1 - Effect of excitation frequency on tip wear in tapping mode atomic force microscopy

AU - Keyvani Janbahan, A

AU - Sadeghian Marnani, H

AU - Goosen, JFL

AU - van Keulen, F

PY - 2014

Y1 - 2014

UR - http://ispm2014.postech.ac.kr/user/indexSub0184.html?codyMenuSeq=253135&siteId=ispm2014&menuUIType=top

M3 - Poster

T2 - International Scanning Probe Microscopy Conference 2014 (ISPM-2014)

Y2 - 30 June 2014 through 2 July 2014

ER -