Optimal Reliability Design of Process Systems at the Conceptual Stage of Design

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

13 Citations (Scopus)

Original language	Undefined/Unknown
Title of host publication	Proceedings of the IEEE Annual Symposium of Reliability and Maintainability (RAMS)
Place of Publication	New York, USA
Publisher	IEEE Service Center
Pages	40-45
Number of pages	6
ISBN (Print)	0149-144X
Publication status	Published - 2003
Event	IEEE Annual Symposium of Reliability and Maintainability (RAMS), Tampa, USA - New York, USA Duration: 27 Jan 2003 → 30 Jan 2003

Name
Publisher	IEEE Service Centre

Conference	IEEE Annual Symposium of Reliability and Maintainability (RAMS), Tampa, USA
Period	27/01/03 → 30/01/03

Keywords

@inproceedings{2442e086f87d41b6b8b7207f8aab3454,

title = "Optimal Reliability Design of Process Systems at the Conceptual Stage of Design",

keywords = "conference contrib. refereed, Conf.proc. > 3 pag",

author = "HD Goel and J Grievink and PM Herder and MPC Weijnen",

year = "2003",

language = "Undefined/Unknown",

isbn = "0149-144X",

publisher = "IEEE Service Center",

pages = "40--45",

booktitle = "Proceedings of the IEEE Annual Symposium of Reliability and Maintainability (RAMS)",

note = "IEEE Annual Symposium of Reliability and Maintainability (RAMS), Tampa, USA ; Conference date: 27-01-2003 Through 30-01-2003",

}

Optimal Reliability Design of Process Systems at the Conceptual Stage of Design. / Goel, HD; Grievink, J ; Herder, PM et al.
Proceedings of the IEEE Annual Symposium of Reliability and Maintainability (RAMS). New York, USA: IEEE Service Center, 2003. p. 40-45.

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

TY - GEN

T1 - Optimal Reliability Design of Process Systems at the Conceptual Stage of Design

AU - Goel, HD

AU - Grievink, J

AU - Herder, PM

AU - Weijnen, MPC

PY - 2003

Y1 - 2003

KW - conference contrib. refereed

KW - Conf.proc. > 3 pag

M3 - Conference contribution

SN - 0149-144X

SP - 40

EP - 45

BT - Proceedings of the IEEE Annual Symposium of Reliability and Maintainability (RAMS)

PB - IEEE Service Center

CY - New York, USA

T2 - IEEE Annual Symposium of Reliability and Maintainability (RAMS), Tampa, USA

Y2 - 27 January 2003 through 30 January 2003

ER -