Data underlying the publication: In situ reflectometry and diffraction investigation of the multiscale structure of p-type polysilicon passivating contacts for c-Si solar cells
Data corresponding to the publication 'In situ reflectometry and diffraction investigation of the multiscale structure of p-type polysilicon passivating contacts for c-Si solar cells' in ACS Applied Materials and Interfaces. The data are composed of X-ray reflectometry (XRR), Grazing Incidence X-ray diffraction (GIXRD) and lifetime measurements of passivating contacts for c-Si solar cells.
Bannenberg, L. (Creator), Morisset, A. (Creator), Famprikis, T. (Creator) (29 Mar 2022). Data underlying the publication: In situ reflectometry and diffraction investigation of the multiscale structure of p-type polysilicon passivating contacts for c-Si solar cells. TU Delft - 4TU.ResearchData. 10.4121/19425749