INIS
ion beams
75%
lamellae
60%
transmission electron microscopy
57%
microscopes
50%
cryogenics
50%
four-dimensional calculations
50%
thickness
50%
electron beams
50%
fluorescence
50%
fabrication
48%
milling
33%
scanning electron microscopy
32%
electrons
26%
signals
25%
Engineering
Focused Ion Beam
100%
Transmissions
60%
Milling (Machining)
55%
Estimation
50%
Local Thickness
50%
Quantitative Evaluation
25%
Signal Intensity
25%
Direct Detection
25%
Demonstrates
25%
Obtains
25%
Fields
25%
Material Science
Fluorescence
50%
Focused Ion Beam
50%
Detector
50%
Amorphous Material
50%
Scanning Transmission Electron Microscopy
50%
Scanning Electron Microscopy
50%
Diffraction Pattern
25%