3D microstructural and texture characterization by means of focused ion beam microscope and integrated EBSD system.

RH Petrov, O León García, LAI Kestens

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

    Original languageUndefined/Unknown
    Title of host publicationProceedings of the 25th Jubilee International Scientific Conference MTF 2007
    EditorsB Tabakova, P Dobrzev, I Yankova, R Dimitrova, B Saikova
    Place of PublicationSofia, Bulgaria
    PublisherPublishing House Technical University
    Pages34-39
    Number of pages6
    ISBN (Print)978-954-438-623-8
    Publication statusPublished - 2007
    Event25th Jubilee International Scientific Conference MTF 2007 - Sofia, Bulgaria
    Duration: 14 Sep 200716 Sep 2007

    Publication series

    Name
    PublisherPublishing House Technical University

    Conference

    Conference25th Jubilee International Scientific Conference MTF 2007
    Period14/09/0716/09/07

    Keywords

    • Conf.proc. > 3 pag

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