A 0.7 e- rms temporal-readout-noise CMOS image sensor for low-light-level imaging

Y Chen, Y Xu, Y Chae, A Mierop, X Wang, AJP Theuwissen

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

58 Citations (Scopus)
Original languageEnglish
Title of host publicationDigest of Technical Papers - 2012 IEEE International Solid-State Circuits Conference.
EditorsH Hidaka, B Nauta et al
Place of PublicationPiscataway, NJ, USA
PublisherIEEE Society
Pages384-386
Number of pages3
ISBN (Print)978-1-4673-0376-7
DOIs
Publication statusPublished - 2012
Event59th ISSCC, San Francisco, CA, USA - Piscataway, NJ, USA
Duration: 19 Feb 201223 Feb 2012

Publication series

Name
PublisherIEEE

Conference

Conference59th ISSCC, San Francisco, CA, USA
Period19/02/1223/02/12

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