A Bayesian defect-based physics-guided neural network model for probabilistic fatigue endurance limit evaluation

Alessandro Tognan*, Andrea Patanè, Luca Laurenti, Enrico Salvati

*Corresponding author for this work

Research output: Contribution to journalArticleScientificpeer-review

3 Citations (Scopus)
57 Downloads (Pure)

Abstract

Accurate fatigue assessment of material plagued by defects is of utmost importance to guarantee safety and service continuity in engineering components. This study shows how state-of-the-art semi-empirical models can be endowed with additional defect descriptors to probabilistically predict the occurrence of fatigue failures by exploiting advanced Bayesian Physics-guided Neural Network (B-PGNN) approaches. A B-PGNN is thereby developed to predict the fatigue failure probability of a sample containing defects, referred to a given fatigue endurance limit. In this framework, a robustly calibrated El Haddad's curve is exploited as the prior physics reinforcement of the probabilistic model, i.e., prior knowledge. Following, a likelihood function is built and the B-PGNN is trained via Bayesian Inference, thus calculating the posterior of the parameters. The arbitrariness of the choice of the related architecture is circumvented through a Bayesian model selection strategy. A case-study is analysed to prove the robustness of the proposed approach. This methodology proposes an advanced practical approach to help support the probabilistic design against fatigue failure.

Original languageEnglish
Article number116521
Number of pages21
JournalComputer Methods in Applied Mechanics and Engineering
Volume418
DOIs
Publication statusPublished - 2024

Keywords

  • Additive manufacturing
  • Bayesian Physics-guided Neural Networks
  • Defects
  • Fatigue strength
  • Uncertainty quantification

Fingerprint

Dive into the research topics of 'A Bayesian defect-based physics-guided neural network model for probabilistic fatigue endurance limit evaluation'. Together they form a unique fingerprint.

Cite this