A degradation model of aluminum electrolytic capacitors for LED drivers

B Sun; X Fan; CA Yuan; C Qian; G Zhang

doi:10.1109/EuroSimE.2015.7103124

A degradation model of aluminum electrolytic capacitors for LED drivers

B Sun, X Fan, CA Yuan, C Qian, G Zhang

Signal Processing Systems

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

11 Citations (Scopus)

Original language	English
Title of host publication	Proceedings of the 16th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems
Place of Publication	Piscataway, NJ
Publisher	IEEE Society
Pages	1-4
Number of pages	4
ISBN (Print)	978-1-4799-9949-1
DOIs	https://doi.org/10.1109/EuroSimE.2015.7103124
Publication status	Published - 2015
Event	EuroSimE 2015: 16th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems - Budapest, Hungary Duration: 19 Apr 2015 → 22 Apr 2015 Conference number: 16 https://www.eurosime.org/index.php/2015-budapest/ (Conference program) https://ieeexplore-ieee-org.tudelft.idm.oclc.org/servlet/opac?punumber=7095627 (Proceedings)

Conference

Conference	EuroSimE 2015
Abbreviated title	EuroSimE 2015
Country/Territory	Hungary
City	Budapest
Period	19/04/15 → 22/04/15
Internet address	https://www.eurosime.org/index.php/2015-budapest/ (Conference program) https://ieeexplore-ieee-org.tudelft.idm.oclc.org/servlet/opac?punumber=7095627 (Proceedings)

Bibliographical note

harvest

Access to Document

10.1109/EuroSimE.2015.7103124

Cite this

@inproceedings{35788e54e8574e488dcf91f8ff814025,

title = "A degradation model of aluminum electrolytic capacitors for LED drivers",

author = "B Sun and X Fan and CA Yuan and C Qian and G Zhang",

note = "harvest; EuroSimE 2015 : 16th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2015 ; Conference date: 19-04-2015 Through 22-04-2015",

year = "2015",

doi = "10.1109/EuroSimE.2015.7103124",

language = "English",

isbn = "978-1-4799-9949-1",

pages = "1--4",

booktitle = "Proceedings of the 16th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems",

publisher = "IEEE Society",

url = "https://www.eurosime.org/index.php/2015-budapest/, https://ieeexplore-ieee-org.tudelft.idm.oclc.org/servlet/opac?punumber=7095627",

}

Sun, B, Fan, X, Yuan, CA, Qian, C & Zhang, G 2015, A degradation model of aluminum electrolytic capacitors for LED drivers. in Proceedings of the 16th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems. IEEE Society, Piscataway, NJ, pp. 1-4, EuroSimE 2015, Budapest, Hungary, 19/04/15. https://doi.org/10.1109/EuroSimE.2015.7103124

A degradation model of aluminum electrolytic capacitors for LED drivers. / Sun, B; Fan, X; Yuan, CA et al.
Proceedings of the 16th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems. Piscataway, NJ: IEEE Society, 2015. p. 1-4.

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

TY - GEN

T1 - A degradation model of aluminum electrolytic capacitors for LED drivers

AU - Sun, B

AU - Fan, X

AU - Yuan, CA

AU - Qian, C

AU - Zhang, G

N1 - Conference code: 16

PY - 2015

Y1 - 2015

U2 - 10.1109/EuroSimE.2015.7103124

DO - 10.1109/EuroSimE.2015.7103124

M3 - Conference contribution

SN - 978-1-4799-9949-1

SP - 1

EP - 4

BT - Proceedings of the 16th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems

PB - IEEE Society

CY - Piscataway, NJ

T2 - EuroSimE 2015

Y2 - 19 April 2015 through 22 April 2015

ER -