A fast methodology to determine characteristics of thousands of grains using 3DXRD. I. Overlapping diffraction peaks and parameters of the experimental setup.

    Research output: Contribution to journalArticleScientificpeer-review

    40 Citations (Scopus)
    Original languageEnglish
    Pages (from-to)693-704
    Number of pages12
    JournalJournal of Applied Crystallography
    Volume45
    DOIs
    Publication statusPublished - 2012

    Keywords

    • CWTS JFIS >= 2.00

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