A new sharpness measure based on Gaussian lines and edges

J Dijk, M van Ginkel, RJ van Asselt, LJ van Vliet, PW Verbeek

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

    Original languageUndefined/Unknown
    Title of host publicationProceedings ASCI 2002
    EditorsEF Deprettere, A Belloum, JWJ Heijnsdijk, F van der Stappen
    Place of PublicationDelft
    PublisherASCI
    Pages39-43
    Number of pages5
    ISBN (Print)90-803086-6-8
    Publication statusPublished - 2002
    Event8th Annual Conf. of the Advanced School for Computing and Imaging, Lochem - Delft
    Duration: 19 Jun 200221 Jun 2002

    Publication series

    Name
    PublisherASCI

    Conference

    Conference8th Annual Conf. of the Advanced School for Computing and Imaging, Lochem
    Period19/06/0221/06/02

    Keywords

    • conference contrib. non-refer.
    • Geen BTA classificatie

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