A nonlinear degradation path dependent end-of-life estimation framework from noisy observations

Research output: Contribution to journalArticleScientificpeer-review

12 Citations (Scopus)
Original languageEnglish
Pages (from-to)1213-1217
Number of pages5
JournalMicroelectronics Reliability
Volume53
Issue number9-11
DOIs
Publication statusPublished - 2013

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