A nonlinear degradation path dependent end-of-life estimation framework from noisy observations

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13 Citations (Scopus)

Original language	English
Pages (from-to)	1213-1217
Number of pages	5
Journal	Microelectronics Reliability
Volume	53
Issue number	9-11
DOIs	https://doi.org/10.1016/j.microrel.2013.07.058
Publication status	Published - 2013

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@article{d8d71f1ad4f745e897e90c58a8b4b268,

title = "A nonlinear degradation path dependent end-of-life estimation framework from noisy observations",

author = "{Cucu Laurenciu}, N and SD Cotofana",

year = "2013",

doi = "10.1016/j.microrel.2013.07.058",

language = "English",

volume = "53",

pages = "1213--1217",

journal = "Microelectronics Reliability",

issn = "0026-2714",

publisher = "Elsevier",

number = "9-11",

}

TY - JOUR

T1 - A nonlinear degradation path dependent end-of-life estimation framework from noisy observations

AU - Cucu Laurenciu, N

AU - Cotofana, SD

PY - 2013

Y1 - 2013

U2 - 10.1016/j.microrel.2013.07.058

DO - 10.1016/j.microrel.2013.07.058

M3 - Article

SN - 0026-2714

VL - 53

SP - 1213

EP - 1217

JO - Microelectronics Reliability

JF - Microelectronics Reliability

IS - 9-11

ER -