A novel 4H-SiC multiple stepped SGT MOSFET with improved high frequency figure of merit

Jingping Zhang, Houcai Luo, Huan Wu, Zeping Wang, Bofeng Zheng, Guoqi Zhang, Xianping Chen*

*Corresponding author for this work

Research output: Contribution to journalArticleScientificpeer-review

Abstract

A novel 4H-SiC Multiple Stepped SGT MOSFET (MSGT-MOSFET) is presented and investigated utilizing TCAD simulations in this paper. We have quantitatively studied the characteristics of the device through simulation modeling and physical model calculations, and comparatively analyzed the performance and application prospects of this novel device. The gate-to-drain capacitance (Cgd) and gate-to-drain charge (Qgd) of the MSGT-MOSFET are significantly reduced in comparison with the double trench MOSFET (DT-MOSFET) and the conventional SGT MOSFET (CSGT-MOSFET), due to the reduction of the overlapping area of the split gate (SG) structure and drift region. Therefore, the obtained high frequency figure of merit (HF-FOM) defined as [Ron × Cgd] reduced by 23.9% compared with DT-MOSFET and CSGT-MOSFET. And the HF-FOM [Ron × Qgd] for the MSGT-MOSFET significantly decreased by 71% and 50%, respectively, compared to that of the DT-MOSFET and CSGT-MOSFET. Furthermore, the switching loss is also simulated and calculated. And the total switching loss of the proposed MSGT-MOSFET realizes 42.9% and 21.7% reduction in comparison with the DT-MOSFET and CSGT-MOSFET. The overall enhanced performances suggest that the MSGT-MOSFET is an excellent choice for high frequency power electronic applications.

Original languageEnglish
Article number125955
Number of pages11
JournalPhysica Scripta
Volume98
Issue number12
DOIs
Publication statusPublished - 2023

Bibliographical note

Green Open Access added to TU Delft Institutional Repository ‘You share, we take care!’ – Taverne project https://www.openaccess.nl/en/you-share-we-take-care
Otherwise as indicated in the copyright section: the publisher is the copyright holder of this work and the author uses the Dutch legislation to make this work public.

Funding

This work was supported by the General Program of National Natural Science Foundation of China under Grant No. 62071073, the Frontier Innovation Program under Grant No. 19-163-00-KX-002-024-01 and the Key Laboratory Open Fund under Grant No. GD20201.

Keywords

  • 4H-SiC MOSFET
  • Cgd
  • HF-FOM
  • Qgd
  • SG
  • switching loss

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