A scattering model for surface-textured thin films

K Jaeger; M Zeman

doi:doi:10.1063/1.3254239

A scattering model for surface-textured thin films

K Jaeger, M Zeman

Photovoltaic Materials and Devices

Research output: Contribution to journal › Article › Scientific › peer-review

Abstract

We present a mathematical model that relates the surface morphology of randomly surface-textured thin films with the intensity distribution of scattered light. The model is based on the first order Born approximation [see e. g., M. Born and E. Wolf, Principles of Optics, 7th ed. (Cambridge University Press, Cambridge, England, 1999)] and on Fraunhofer scattering. Scattering data of four transparent conductive oxide films with different surface textures were used to validate the model and good agreement between the experimental and calculated intensity distribution was obtained. (C) 2009 American Institute of Physics. [doi: 10.1063/1.3254239]

Original language	Undefined/Unknown
Pages (from-to)	1-3
Number of pages	3
Journal	Applied Physics Letters
Volume	95
Issue number	17
DOIs	https://doi.org/doi:10.1063/1.3254239
Publication status	Published - 2009

Keywords

academic journal papers
CWTS 0.75 <= JFIS < 2.00

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This output contributes to the following UN Sustainable Development Goals (SDGs)

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doi:10.1063/1.3254239

Cite this

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