Accurate self-characterization of mismatches in a capacitor array of a digitally-controlled oscillator

Oren Eliezer; Bogdan Staszewski; Jaimin Mehta; Farooq Jabbar; Imran Bashir

doi:10.1109/DCAS.2010.5955030

Accurate self-characterization of mismatches in a capacitor array of a digitally-controlled oscillator

Oren Eliezer, Bogdan Staszewski, Jaimin Mehta, Farooq Jabbar^*, Imran Bashir

^*Corresponding author for this work

Electronics

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

13 Citations (Scopus)

Abstract

A programmable self-characterization technique is presented, whose purpose is to determine the extent of mismatches present in a variable-capacitor (varactor) array as part of an LC tank of a digitally controlled oscillator (DCO). The varactor array represents a digital-to-analog conversion function, such that mismatches in it cause distortion in the DCO's digital frequency tracking and modulation. The presented technique, relying exclusively on internal resources in the system-on-chip (SoC) and on dedicated software, is implemented in a 65nm CMOS Digital RF Processor (DRP) based transceiver, and demonstrates sufficient accuracy to allow relatively quick measurements of mismatches of a few percent.

Original language	English
Title of host publication	2010 IEEE Dallas Circuits and Systems Workshop
Publisher	IEEE
Pages	1-4
Number of pages	4
ISBN (Electronic)	978-1-4244-9536-8
ISBN (Print)	978-1-4244-9535-1
DOIs	https://doi.org/10.1109/DCAS.2010.5955030
Publication status	Published - 1 Dec 2010
Event	IEEE DCAS-10 - Piscataway, NJ, USA Duration: 17 Oct 2010 → 18 Oct 2010

Conference

Conference	IEEE DCAS-10
Period	17/10/10 → 18/10/10

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10.1109/DCAS.2010.5955030

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title = "Accurate self-characterization of mismatches in a capacitor array of a digitally-controlled oscillator",

abstract = "A programmable self-characterization technique is presented, whose purpose is to determine the extent of mismatches present in a variable-capacitor (varactor) array as part of an LC tank of a digitally controlled oscillator (DCO). The varactor array represents a digital-to-analog conversion function, such that mismatches in it cause distortion in the DCO's digital frequency tracking and modulation. The presented technique, relying exclusively on internal resources in the system-on-chip (SoC) and on dedicated software, is implemented in a 65nm CMOS Digital RF Processor (DRP) based transceiver, and demonstrates sufficient accuracy to allow relatively quick measurements of mismatches of a few percent.",

author = "Oren Eliezer and Bogdan Staszewski and Jaimin Mehta and Farooq Jabbar and Imran Bashir",

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T1 - Accurate self-characterization of mismatches in a capacitor array of a digitally-controlled oscillator

AU - Eliezer, Oren

AU - Staszewski, Bogdan

AU - Mehta, Jaimin

AU - Jabbar, Farooq

AU - Bashir, Imran

PY - 2010/12/1

Y1 - 2010/12/1

N2 - A programmable self-characterization technique is presented, whose purpose is to determine the extent of mismatches present in a variable-capacitor (varactor) array as part of an LC tank of a digitally controlled oscillator (DCO). The varactor array represents a digital-to-analog conversion function, such that mismatches in it cause distortion in the DCO's digital frequency tracking and modulation. The presented technique, relying exclusively on internal resources in the system-on-chip (SoC) and on dedicated software, is implemented in a 65nm CMOS Digital RF Processor (DRP) based transceiver, and demonstrates sufficient accuracy to allow relatively quick measurements of mismatches of a few percent.

AB - A programmable self-characterization technique is presented, whose purpose is to determine the extent of mismatches present in a variable-capacitor (varactor) array as part of an LC tank of a digitally controlled oscillator (DCO). The varactor array represents a digital-to-analog conversion function, such that mismatches in it cause distortion in the DCO's digital frequency tracking and modulation. The presented technique, relying exclusively on internal resources in the system-on-chip (SoC) and on dedicated software, is implemented in a 65nm CMOS Digital RF Processor (DRP) based transceiver, and demonstrates sufficient accuracy to allow relatively quick measurements of mismatches of a few percent.

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M3 - Conference contribution

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SN - 978-1-4244-9535-1

SP - 1

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BT - 2010 IEEE Dallas Circuits and Systems Workshop

PB - IEEE

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Y2 - 17 October 2010 through 18 October 2010

ER -

Accurate self-characterization of mismatches in a capacitor array of a digitally-controlled oscillator

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