Accurate self-characterization of mismatches in a capacitor array of a digitally-controlled oscillator

Oren Eliezer, Bogdan Staszewski, Jaimin Mehta, Farooq Jabbar*, Imran Bashir

*Corresponding author for this work

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

12 Citations (Scopus)

Abstract

A programmable self-characterization technique is presented, whose purpose is to determine the extent of mismatches present in a variable-capacitor (varactor) array as part of an LC tank of a digitally controlled oscillator (DCO). The varactor array represents a digital-to-analog conversion function, such that mismatches in it cause distortion in the DCO's digital frequency tracking and modulation. The presented technique, relying exclusively on internal resources in the system-on-chip (SoC) and on dedicated software, is implemented in a 65nm CMOS Digital RF Processor (DRP) based transceiver, and demonstrates sufficient accuracy to allow relatively quick measurements of mismatches of a few percent.

Original languageEnglish
Title of host publication2010 IEEE Dallas Circuits and Systems Workshop
PublisherIEEE
Pages1-4
Number of pages4
ISBN (Electronic)978-1-4244-9536-8
ISBN (Print)978-1-4244-9535-1
DOIs
Publication statusPublished - 1 Dec 2010
EventIEEE DCAS-10 - Piscataway, NJ, USA
Duration: 17 Oct 201018 Oct 2010

Conference

ConferenceIEEE DCAS-10
Period17/10/1018/10/10

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