Applicability of iTIRM for roughness reduction monitoring

RJM van der Bijl, H van Brug, M Singh, JJM Braat

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientific

1 Citation (Scopus)
Original languageUndefined/Unknown
Title of host publicationOptical Manufacturing and Testing III, Proceedings of SPIE.
EditorsH Philip Stahl
Pages340-344
Number of pages5
Publication statusPublished - 2001

Publication series

Name
Name
Volume4451

Keywords

  • Conf.proc. > 3 pag

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