Atomic-scale electron microscopy at ambient pressure

JF Creemer, S Helveg, GH Hoveling, S Ullmaan, AM Molenbroek, PM Sarro, HW Zandbergen

Research output: Contribution to journalArticleScientificpeer-review

233 Citations (Scopus)
Original languageUndefined/Unknown
Pages (from-to)993-998
Number of pages6
JournalUltramicroscopy
Volume108
Publication statusPublished - 2008

Keywords

  • academic journal papers
  • CWTS 0.75 <= JFIS < 2.00

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