Atomic-scale electron microscopy at ambient pressure

JF Creemer, S Helveg, GH Hoveling, S Ullmaan, AM Molenbroek, PM Sarro, HW Zandbergen

Research output: Contribution to journal › Article › Scientific › peer-review

Keywords

@article{2e807f727c184aa7b68d937f16b25b5f,

title = "Atomic-scale electron microscopy at ambient pressure",

keywords = "academic journal papers, CWTS 0.75 <= JFIS < 2.00",

author = "JF Creemer and S Helveg and GH Hoveling and S Ullmaan and AM Molenbroek and PM Sarro and HW Zandbergen",

year = "2008",

language = "Undefined/Unknown",

volume = "108",

pages = "993--998",

journal = "Ultramicroscopy",

issn = "0304-3991",

publisher = "Elsevier",

}

TY - JOUR

T1 - Atomic-scale electron microscopy at ambient pressure

AU - Creemer, JF

AU - Helveg, S

AU - Hoveling, GH

AU - Ullmaan, S

AU - Molenbroek, AM

AU - Sarro, PM

AU - Zandbergen, HW

PY - 2008

Y1 - 2008

KW - academic journal papers

KW - CWTS 0.75 <= JFIS < 2.00

M3 - Article

SN - 0304-3991

VL - 108

SP - 993

EP - 998

JO - Ultramicroscopy

JF - Ultramicroscopy

ER -