Comparison of Si and Ge low-loss spectra to interpret the Ge contrast in EFTEM images of Si1-xGex nanostructures

R Pantel, MC Cheynet, FD Tichelaar

    Research output: Contribution to journalArticleScientificpeer-review

    6 Citations (Scopus)
    Original languageUndefined/Unknown
    Pages (from-to)657-665
    Number of pages9
    JournalMicron
    Volume37
    Issue number7
    Publication statusPublished - 2006

    Keywords

    • CWTS JFIS < 0.75

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