Computer assisted drift correction for transmission electron microscopes

J Jansen, HW Zandbergen

    Research output: Contribution to conferencePosterProfessional

    Original languageEnglish
    Publication statusPublished - 2010
    Event17th International Microscopy Congress (IMC17) - Rio de Janeiro, Brazil
    Duration: 19 Sep 201024 Sep 2010

    Conference

    Conference17th International Microscopy Congress (IMC17)
    Period19/09/1024/09/10

    Keywords

    • other public output
    • Geen BTA classificatie

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