Correspondence free 3D statistical shape model fitting to sparse X-ray projections

N Baka, WJ Niessen, BL Kaptein, T van Walsum, L Ferarrini, JHC Reiber, BPF Lelieveldt

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

3 Citations (Scopus)
Original languageEnglish
Title of host publicationMedical Imaging 2010: Image processing
EditorsDR Haynor, BM Dawant
Place of PublicationBellingham, WA, USA
PublisherSPIE
Pages1-9
Number of pages9
ISBN (Print)9780819480248
DOIs
Publication statusPublished - 2010
EventSPIE - Medical imaging 2010: Image processing, San Diego, CA, USA - Bellingham, WA, USA
Duration: 14 Feb 201016 Feb 2010

Publication series

Name
PublisherSPIE
NameProceedings of SPIE- International Society for Optical Engineering
Volume7623
ISSN (Print)0277-786X

Conference

ConferenceSPIE - Medical imaging 2010: Image processing, San Diego, CA, USA
Period14/02/1016/02/10

Keywords

  • academic journal papers
  • Peer-lijst tijdschrift

Cite this

Baka, N., Niessen, WJ., Kaptein, BL., van Walsum, T., Ferarrini, L., Reiber, JHC., & Lelieveldt, BPF. (2010). Correspondence free 3D statistical shape model fitting to sparse X-ray projections. In DR. Haynor, & BM. Dawant (Eds.), Medical Imaging 2010: Image processing (pp. 1-9). (Proceedings of SPIE- International Society for Optical Engineering; Vol. 7623). SPIE. https://doi.org/10.1117/12.840935