Critical composition dependence of the hydrogenation of Mg2±δ Ni thin films

D. M. Borsa; W. Lohstroh; R. Gremaud; J. H. Rector; B. Dam; R. J. Wijngaarden; R. Griessen

doi:10.1016/j.jallcom.2006.03.061

Critical composition dependence of the hydrogenation of Mg_2±δ Ni thin films

D. M. Borsa^*, W. Lohstroh, R. Gremaud, J. H. Rector, B. Dam, R. J. Wijngaarden, R. Griessen

^*Corresponding author for this work

ChemE/Chemical Engineering

Research output: Contribution to journal › Article › Scientific › peer-review

6 Citations (Scopus)

Abstract

The hydrogenation of metallic Mg₂ Ni films was shown to proceed via a self-organized double layering of transparent Mg₂ NiH₄ and metallic Mg₂ NiH_0.3. For stoichiometries departing from Mg₂ Ni we conclude from optical reflection, transmission and electrical measurements that the hydrogenation process involves two competing effects: (i) the nucleation of the initial Mg₂ NiH₄ layer near the substrate and the ensuing growth of this layer and (ii) the slow random nucleation of the same phase within the remaining part of the film. Which process dominates depends critically on the stoichiometry of the parent metal alloy.

Original language	English
Pages (from-to)	34-39
Number of pages	6
Journal	Journal of Alloys and Compounds
Volume	428
Issue number	1-2
DOIs	https://doi.org/10.1016/j.jallcom.2006.03.061
Publication status	Published - 31 Jan 2007

Keywords

Hydrogen storage materials
Light absorption and reflection
Thin films

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10.1016/j.jallcom.2006.03.061

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@article{c7d95852874d4fb988827163e3850811,

title = "Critical composition dependence of the hydrogenation of Mg2±δ Ni thin films",

abstract = "The hydrogenation of metallic Mg2 Ni films was shown to proceed via a self-organized double layering of transparent Mg2 NiH4 and metallic Mg2 NiH0.3. For stoichiometries departing from Mg2 Ni we conclude from optical reflection, transmission and electrical measurements that the hydrogenation process involves two competing effects: (i) the nucleation of the initial Mg2 NiH4 layer near the substrate and the ensuing growth of this layer and (ii) the slow random nucleation of the same phase within the remaining part of the film. Which process dominates depends critically on the stoichiometry of the parent metal alloy.",

keywords = "Hydrogen storage materials, Light absorption and reflection, Thin films",

author = "Borsa, {D. M.} and W. Lohstroh and R. Gremaud and Rector, {J. H.} and B. Dam and Wijngaarden, {R. J.} and R. Griessen",

year = "2007",

month = jan,

day = "31",

doi = "10.1016/j.jallcom.2006.03.061",

language = "English",

volume = "428",

pages = "34--39",

journal = "Journal of Alloys and Compounds",

issn = "0925-8388",

publisher = "Elsevier",

number = "1-2",

}

TY - JOUR

T1 - Critical composition dependence of the hydrogenation of Mg2±δ Ni thin films

AU - Borsa, D. M.

AU - Lohstroh, W.

AU - Gremaud, R.

AU - Rector, J. H.

AU - Dam, B.

AU - Wijngaarden, R. J.

AU - Griessen, R.

PY - 2007/1/31

Y1 - 2007/1/31

N2 - The hydrogenation of metallic Mg2 Ni films was shown to proceed via a self-organized double layering of transparent Mg2 NiH4 and metallic Mg2 NiH0.3. For stoichiometries departing from Mg2 Ni we conclude from optical reflection, transmission and electrical measurements that the hydrogenation process involves two competing effects: (i) the nucleation of the initial Mg2 NiH4 layer near the substrate and the ensuing growth of this layer and (ii) the slow random nucleation of the same phase within the remaining part of the film. Which process dominates depends critically on the stoichiometry of the parent metal alloy.

AB - The hydrogenation of metallic Mg2 Ni films was shown to proceed via a self-organized double layering of transparent Mg2 NiH4 and metallic Mg2 NiH0.3. For stoichiometries departing from Mg2 Ni we conclude from optical reflection, transmission and electrical measurements that the hydrogenation process involves two competing effects: (i) the nucleation of the initial Mg2 NiH4 layer near the substrate and the ensuing growth of this layer and (ii) the slow random nucleation of the same phase within the remaining part of the film. Which process dominates depends critically on the stoichiometry of the parent metal alloy.

KW - Hydrogen storage materials

KW - Light absorption and reflection

KW - Thin films

UR - http://www.scopus.com/inward/record.url?scp=33845691789&partnerID=8YFLogxK

U2 - 10.1016/j.jallcom.2006.03.061

DO - 10.1016/j.jallcom.2006.03.061

M3 - Article

AN - SCOPUS:33845691789

SN - 0925-8388

VL - 428

SP - 34

EP - 39

JO - Journal of Alloys and Compounds

JF - Journal of Alloys and Compounds

IS - 1-2

ER -

Critical composition dependence of the hydrogenation of Mg_2±δ Ni thin films

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Keywords

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