Diffraction-line Broadening Analysis of Dislocation Configurations.

AC Vermeulen, R Delhez, Th.H de Keijser, EJ Mittemeijer

Research output: Chapter in Book/Conference proceedings/Edited volume › Chapter › Scientific

Original language	Undefined/Unknown
Title of host publication	Defect and Microstructure Analysis by Diffraction.
Editors	RL Snyder, J Fiala, HJ Bunge
Pages	200-213
Number of pages	14
Publication status	Published - 1999

Keywords

@inbook{06265942b44842cdaf703bf166d99f86,

title = "Diffraction-line Broadening Analysis of Dislocation Configurations.",

keywords = "ZX Int.klas.verslagjaar < 2002",

author = "AC Vermeulen and R Delhez and {de Keijser}, Th.H and EJ Mittemeijer",

year = "1999",

language = "Undefined/Unknown",

isbn = "0198-501897",

pages = "200--213",

editor = "RL Snyder and J Fiala and HJ Bunge",

booktitle = "Defect and Microstructure Analysis by Diffraction.",

}

TY - CHAP

T1 - Diffraction-line Broadening Analysis of Dislocation Configurations.

AU - Vermeulen, AC

AU - Delhez, R

AU - de Keijser, Th.H

AU - Mittemeijer, EJ

PY - 1999

Y1 - 1999

KW - ZX Int.klas.verslagjaar < 2002

M3 - Chapter

SN - 0198-501897

SP - 200

EP - 213

BT - Defect and Microstructure Analysis by Diffraction.

A2 - Snyder, RL

A2 - Fiala, J

A2 - Bunge, HJ

ER -