Diffraction-line Broadening Analysis of Dislocation Configurations.

AC Vermeulen, R Delhez, Th.H de Keijser, EJ Mittemeijer

    Research output: Chapter in Book/Conference proceedings/Edited volumeChapterScientific

    Original languageUndefined/Unknown
    Title of host publicationDefect and Microstructure Analysis by Diffraction.
    EditorsRL Snyder, J Fiala, HJ Bunge
    Number of pages14
    Publication statusPublished - 1999


    • ZX Int.klas.verslagjaar < 2002

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