Effect of Electron Beam Parameters on Simulated CBED Patterns from Edge-on Grain Boundaries.

Regina Bokel, FD Tichelaar, FW Schapink

    Research output: Contribution to journal › Article › Scientific › peer-review

    Original languageUndefined/Unknown
    Pages (from-to)55-59
    Number of pages5
    JournalJournal of Microscopy
    Volume197
    Publication statusPublished - 2000

    Bibliographical note

    ISSN 0022-2720

    Keywords

    • ZX Int.klas.verslagjaar < 2002

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