Effect of Electron Beam Parameters on Simulated CBED Patterns from Edge-on Grain Boundaries.

    Research output: Contribution to journalArticleScientificpeer-review

    Original languageUndefined/Unknown
    Pages (from-to)55-59
    Number of pages5
    JournalJournal of Microscopy
    Volume197
    Publication statusPublished - 2000

    Keywords

    • ZX Int.klas.verslagjaar < 2002

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