TY - JOUR
T1 - Effect of stacking fault energy on the thickness and density of annealing twins in recrystallized FCC medium and high-entropy alloys
AU - Schneider, Mike
AU - Couzinié, Jean Philippe
AU - Shalabi, Amin
AU - Ibrahimkhel, Farhad
AU - Ferrari, Alberto
AU - Körmann, Fritz
AU - Laplanche, Guillaume
PY - 2024
Y1 - 2024
N2 - This work aims to predict the microstructure of recrystallized medium and high-entropy alloys (MEAs and HEAs) with a face-centered cubic structure, in particular the density of annealing twins and their thickness. Eight MEAs and five HEAs from the Cr-Mn-Fe-Co-Ni system are considered, which have been cast, homogenized, cold-worked and recrystallized to obtain different grain sizes. This work thus provides a database that could be used for data mining to take twin boundary engineering for alloy development to the next level. Since the stacking fault energy is known to strongly affect recrystallized microstructures, the latter was determined at 293 K using the weak beam dark-field technique and compared with ab initio simulations, which additionally allowed to calculate its temperature dependence. Finally, we show that all these data can be rationalized based on theories and empirical relationships that were proposed for pure metals and binary Cu-based alloys.
AB - This work aims to predict the microstructure of recrystallized medium and high-entropy alloys (MEAs and HEAs) with a face-centered cubic structure, in particular the density of annealing twins and their thickness. Eight MEAs and five HEAs from the Cr-Mn-Fe-Co-Ni system are considered, which have been cast, homogenized, cold-worked and recrystallized to obtain different grain sizes. This work thus provides a database that could be used for data mining to take twin boundary engineering for alloy development to the next level. Since the stacking fault energy is known to strongly affect recrystallized microstructures, the latter was determined at 293 K using the weak beam dark-field technique and compared with ab initio simulations, which additionally allowed to calculate its temperature dependence. Finally, we show that all these data can be rationalized based on theories and empirical relationships that were proposed for pure metals and binary Cu-based alloys.
KW - CoCrFeMnNi HEAs and MEAs
KW - Electron backscatter diffraction
KW - Grain boundary engineering
KW - Recrystallization
KW - Transmission electron microscopy (TEM)
UR - http://www.scopus.com/inward/record.url?scp=85175826120&partnerID=8YFLogxK
U2 - 10.1016/j.scriptamat.2023.115844
DO - 10.1016/j.scriptamat.2023.115844
M3 - Article
AN - SCOPUS:85175826120
SN - 1359-6462
VL - 240
JO - Scripta Materialia
JF - Scripta Materialia
M1 - 115844
ER -